Introduction

In situ TEM, as a very practical high-end characterizationtechnology, its extremely high resolution is very suitablefor "in situ dynamic" observation of the microstructure ofvarious energy storage materials; In addition, combined with selected area electrondiffraction (SAED), Electron energy loss spectroscopy(EELS) and energy dispersive spectrometer (EDX), thestructural and chemical information of materials can beobtained;Therefore,themicrostructurechangesandelectrochemical reaction processes of the entire electrodematerial during the charging and discharging process canbe clearly presented.

Application range:

via TEM in-situ tensile or compression test to studythe plasticity (dislocation dynamics) and fracture ofmaterials

via TEM in-situ heating to study the microstructureevolution at high temperature or during heating up

via TEM electrical test to study the electrochemicalbehavior during a chemical reaction and with onlinemicrostructure evolution observation (e.g. in theresearch of Li-battery)

Representive Results

1. via TEM in-situ compression test to studytheplasticityofmetal

Caption: Dark-field TEM images of a Ni nanopillar beforeand after compression. The high dislocation densityinitially observed in the pillar has disappeared uponcompression. Nature Materials 7, 115-119 (2007).

2. TEM in-situ nanoscratch test

Caption: Dark-field TEM images of a Ni nanopillar beforeand after compression. The high dislocation densityinitially observed in the pillar has disappeared uponcompression. Nature Materials 7, 115-119 (2007).Application 2: TEM in-situ nanoscratch testCaption: An example 1 μN scratch test: (1) Normal andlateral loads and displacements versus time and (2-5)corresponding frames from the in-situ TEM video showingthe buckling of the DLC film in advance of the tip andflattening of the asperities in the tops of the grains.

3. Simultaneous in-situ electrical andmechanical measurements during nanoindentation,compression, or tensile loading

Caption: Electrical characterization during compression ofn-doped VLS-grown silicon nanopillar. D.D. Stauffer, Ph.D.Thesis, “Deformation Mechanisms in Nanoscale BrittleMaterials,” University of Minnesota (2011) pp. 150-152.

Core-shell electrochemical reaction TEM in-situ observationand measuring

4. TEM in-situ test with heating

Caption: Pillar compression of Ni-Based superalloy at1000°C (top) and stress-strain plots from in-situ pillarcompression tests of bond coatings (bottom).

Caption: TEM in-situ observation of oxides morphologyevolution during heating up

Sample Requirement

1. 5mg powder and 0.5ml liquid.

2. Does not contain easily decomposable organic substances.

3. Free from toxic and harmful substances.

4. If the sample is prone to deterioration.

5. It needs to be specified; Liquid, please specify thesolvent.